Scanning transmission helium ion microscopy on carbon nanomembranes

• Daniel Emmrich,
• Annalena Wolff,
• Nikolaus Meyerbröker,
• Jörg K. N. Lindner,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

• energy-filtered transmission electron microscopy measurements. Keywords: carbon nanomembranes; dark field; helium ion microscopy (HIM); scanning transmission ion microscopy (STIM); SRIM simulations; Introduction Throughout the past decade, the helium ion microscope (HIM) has emerged as a versatile

• photoelectron emission angle of 13° with respect to the surface normal. Energy-filtered transmission electron microscopy was conducted at energies of 60 and 80 keV on a Cs-corrected JEOL JEM-ARM200F equipped with a cold field emission gun. A GATAN GIF-Quantum ER image filter and a 2k × 2k CCD camera (GATAN

• between the two cases, and the error of this particular measurement is 9%. To test the validity of the determined thickness and the approach described above, the results from the STIM dark-field imaging are compared to X-ray photoelectron spectroscopy (XPS) and energy-filtered transmission electron

Site-controlled formation of single Si nanocrystals in a buried SiO₂ matrix using ion beam mixing

• Xiaomo Xu,
• Thomas Prüfer,
• Daniel Wolf,
• Hans-Jürgen Engelmann,
• Lothar Bischoff,
• René Hübner,
• Karl-Heinz Heinig,
• Wolfhard Möller,
• Stefan Facsko,
• Johannes von Borany and
• Gregor Hlawacek

Beilstein J. Nanotechnol. 2018, 9, 2883–2892, doi:10.3762/bjnano.9.267

• electron microscopy (TEM) lamella preparation. In all cases, the local distribution and size of the NCs are mapped using energy-filtered transmission electron microscopy (EFTEM). Results and Discussion In Figure 1, a comparison of cross-sectional Si plasmon-loss-filtered TEM images obtained from two Si

• higher than 25 K/s, thus for simplicity, only the time at peak temperature is taken into account for the thermal budget calculation. Energy-filtered transmission electron microscopy (EFTEM) Cross-sectional samples were obtained by classical lamella preparation including sawing, grinding, polishing

• -filtered transmission electron microscopy is performed to obtain quantitative values on the Si NC size and distribution in dependence of the layer stack geometry, ion fluence and thermal budget. Employing a focused Ne+ beam from a helium ion microscope, we demonstrate site-controlled self-assembly of

Nanoanalytics for materials science

• Thilo Glatzel and
• Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1674–1675, doi:10.3762/bjnano.7.159

• applied to investigate magnetite nanoparticles by Kalska-Szostka et al. [4]. TEM was also used in the work of Gutsch et al. who developed a novel energy-filtered transmission electron microscopy (EFTEM) approach using ultrathin TEM membranes [5]. With this method, they were able to accurately study the

Magnetic properties of iron cluster/chromium matrix nanocomposites

• Arne Fischer,
• Robert Kruk,
• Di Wang and
• Horst Hahn

Beilstein J. Nanotechnol. 2015, 6, 1158–1163, doi:10.3762/bjnano.6.117

• energy-filtered transmission electron microscopy (EFTEM) and scanning transmission electron microscopy (STEM) micrographs of the Fe distribution for a 10 vol % Fe1000/Cr sample, specifically prepared for TEM. To avoid subsequent focused ion beam cutting and possible oxidation, the sample was deposited on

Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

• Sebastian Gutsch,
• Daniel Hiller,
• Jan Laube,
• Margit Zacharias and
• Christian Kübel

Beilstein J. Nanotechnol. 2015, 6, 964–970, doi:10.3762/bjnano.6.99

• -von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany 10.3762/bjnano.6.99 Abstract We use high-temperature-stable silicon nitride membranes to investigate single layers of silicon nanocrystal ensembles by energy filtered transmission electron microscopy. The silicon nanocrystals are prepared

• thickness and stoichiometry are below a critical value. Keywords: electron irradiation damage; energy-filtered transmission electron microscopy; membrane; plane view; silicon nanocrystals; size control; size distribution; Introduction Si nanocrystals (Si NC) are interesting for applications in third